CONTACT INFORMATION
28600 Mary's Court,
Easton, MD 21601

Tel: (800) 333-5272
Fax: (410) 822-7526

sales@jascoinc.com 

Semiconductor Instrumentation

FT-IR Full Vacuum Gas Measurement System

To measure low-concentrations of gases with high sensitivity using FT-IR, it can be necessary to remove CO2 and H2O from the instrument and sample compartment as well as the use of a long path gas cell. JASCO offers a high sensitivity full-vacuum gas measurement system with a wide spectral range DLATGS detector and/or a selection of high sensitivity MCT detectors for rapid measurement applications.

System Features

  • Eliminates the effects of water vapor and CO2
  • Stable long-term measurements using sealed optics and an evacuated light path
  • Detects very low concentrations of gases
  • Integrated detectors to cover various application requirements
Click here to view the Semiconductor Brochure.

Click here to view the Semiconductor Application Notebook.




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