MSV-350/370 UV-Vis/NIR Microspectrophotometer

The MSV-300 series is a microspectroscopy system providing transmittance or reflectance measurements of microscopic sample sites for a wide range of wavelengths from ultraviolet to near infrared. Conventional measurements require samples with dimensions comparable to an mm sized optical beam. The MSV-300 series can measure color, film thickness, and other spectral properties of a microscopic area for either large or small samples. The optional automated X-Y-Z stage provides multi-point measurements and surface analysis mapping capabilities.

System Features

• Wide spectral measurement range
  Continuous measurements between 250 and 2,000 nm (MSV-370) using a spectrometer with a wide ban Cassegrain objective.
• Simple operation                                                                                                                                      
  The integrated CCD camera allows verification of the analysis site and sample position while defining the sample aperture on the software system.
• Double-beam system
  Superior measurement stability using a double-beam spectrophotometer.
• Automated X-Y-Z stage
  With the optional automated stage, discrete measurement areas can be selected using the mouse while simultaneously viewing the sample area on the CCD monitor.

Click here to view the MSV-300 Specifications.

Click here to view the Semiconductor Brochure.

Click here to view the Semiconductor Application Notebook.