material science applications

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SiO2 Layer Thickness Measurement

 

The thickness of the epitaxial layer, substrate, etching (residual layer), liquid crystal cell gap, and other semiconductor layers dramatically impacts semiconductor device performance.

 

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Material Science Applications

Evaluation of Carrier Concentrations in GaN
Thursday, 03 May 2012

Gallium Nitride (GaN), which is one of a generation of promising light-emitting materials, can be analyzed by using 514.5 nm excitation to evaluate crystallization and carrier concentration. Using a Visible laser, surface analysis up to nm order in thickness can be performed.

Luminescence Efficiency Measurement
Friday, 27 April 2012

 

The fluorescence quantum efficiency is a value showing the luminescence efficiency of a fluorescent body.

 

Evaluation of Organic EL Materials
Wednesday, 25 April 2012

 

The fluorescent components of plasma display panels and white LED's are generally maintained at high temperatures under actual working conditions.

 

Evaluation of Filters and Mirrors
Thursday, 19 April 2012

 

Optical bandpass filters are designed to transmit a specific wavelength. Composed of thin layers of dielectric materials, the different refractive indices produce constructive.

 

Absolute Reflectance Measurements of a Dichroic Mirror
Monday, 16 April 2012

 

The automatic absolute reflectance measurement accessory can be used to measure the absolute reflectance or transmission of samples automatically. 

 

Development of New PDP Phosphors
Tuesday, 01 May 2012

The plasma display panel (PDP) is expected to dominate the flat panel display market due to an improved viewing angle, faster update speeds, and a crisper picture quality. Gas discharge excitation of Red-Green-Blue (RGB) photoluminescent phosphors is used by the plasma display panel to produce the displayed picture.

Evaluation of Fluorescent Materials at a High Temperature
Thursday, 26 April 2012

 

The fluorescent components of plasma display panels and white LED's are generally maintained at high temperatures under actual working conditions.

 

Evaluation of ITO Films
Monday, 23 April 2012

 

Indium oxide doped with tin oxide (ITO), is used to make transparent conductive coatings. Thin film layers can be deposited by electron-beam evaporation or sputtering. 

 

Luminescent Color Measurement
Wednesday, 18 April 2012

 

Fluorescence analysis is widely used in the analytical chemistry and the biochemistry field as the primary techniques for high sensitivity quantitative measurement.

 

Absolute Reflectance Measurements of SiO2
Friday, 13 April 2012

 

Varying the incidence angle, the absolute reflectance characteristics of SiO2 are analyzed using P and S polarization, to detect Brewster’s angle.

 

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Training for Circular Dichroism

Training for UV-VIS-NIR

October 26-27, 2016

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