The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films and various optical elements.
Coupled with the JASCO V-700 UV/Vis/NIR Spectrophotometers, the instrument system provides measurements of challenging samples with dramatically reduced noise and excellent photometric stability. The incidence and collection angles can also be set in a synchronous mode, simultaneously rotating the sample stage and integrating sphere. Alternatively, the incidence and collection angles can be individually declared in an asynchronous mode. The polarization properties of a sample can also be examined using P or S polarization or by setting the desired polarization angles.
|Wavelength Range||250 nm to 850 nm (ARV-701)
250 nm to 2000 nm (ARV-702)
250 nm to 1800 nm (ARV-703)
|Incidence Angle||5° to 60°(Reflectance mode)
0° to 60°(Transmittance mode)
|Sample Dimensions||Minimum 20(H) x 20(W) x 0.5(T) mm
Maximum 70(H) x 100(W) x 10(T) mm
|Detectors||PMT (all models)
Varying the incidence angle, the transmittance characteristics of a band pass filter are measured. As shown above, the transmittance peak of the band pass filter is shifted about 8 nm to a shorter wavelength range as the incident angle is changed from 0 to 10 degrees.
Varying the incidence angle, the reflectance characteristics of a dichroic mirror using P and S polarization are measured.
By using an angle selective polarizer, measurements of the phase difference of metal films can be provided. Quarter wave plates for evaluation of optical disks can also be inspected.