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The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films and various optical elements.


System Description

Coupled with the JASCO V-700 UV/Vis/NIR Spectrophotometers, the instrument system provides measurements of challenging samples with dramatically reduced noise and excellent photometric stability. The incidence and collection angles can also be set in a synchronous mode, simultaneously rotating the sample stage and integrating sphere. Alternatively, the incidence and collection angles can be individually declared in an asynchronous mode. The polarization properties of a sample can also be examined using P or S polarization or by setting the desired polarization angles.

System Features

  • PC control of instrument conditions such as incidence and collection angles and spectrum measurement parameters
  • Wide range of instrument wavelengths, from the ultraviolet to near infrared region
  • Superior photometric stability using a double-beam optical configuration
  • Individual control of incidence and collection angles
  • Standard polarization measurement capability
  • Purpose-built sample holder simplifies loading/removal of samples

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Training for Circular Dichroism

Training for UV-VIS-NIR

October 26-27, 2016

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