The EMV-100 electric field modulation spectrophotometer is capable of measuring changes in absorbance in the ultraviolet, visible and near-infrared region caused by application of an electrical field (several 100 V/µm) to film samples of optical performance materials. This system can perform quantitative measurement of changes in the dipole moment or polarizability and other characteristic sample parameters as a result of electronic excitation. This instrument is expected to extend the application to the evaluation of organic electro-luminescent (EL) materials, organic optical conversion molecules, and other molecular electronics elements. Furthermore, it will contribute to the elucidation of structures and functions related to optical excitation.
Click here to view the
Semiconductor Brochure.
Click here to view the
Semiconductor Application Notebook.