|
|
|
  |
|
The FT-IR-4000 Series:
Robust, High Sensitivity FT-IR Systems for Education and Routine Analysis
 |
Higher Signal-to-Noise Ratio than Competitive Systems |
|
Easy, Single Step Analysis and Data Processing |
|
IR Imaging with Multichannel Microscope and Rapid Scan Option |
The new JASCO FT/IR-4100 and FT/IR-4200 were designed to provide operational features and sensitivity levels found only in more expensive instruments. The innovative technology incorporated in these instruments results in exceptionally high signal-to-noise ratio specifications. Both models offer exceptional flexibility and can be easily upgraded to meet new requirements. Optional expandability includes microanalysis with an IR microscope, IR imaging with a multichannel microscope, and rapid scan option. The JASCO Quick Start System enables users of all experience levels to measure samples and perform data processing functions quickly and easily with a simple push of a button.
FT-IR-4100
· Max resolution: 0.9 cm-1
· S/N ratio: 22,000:1
The FT/IR-4100 offers the most cost effective choice for a variety of IR applications. It is rugged and reliable with all of the features required in a general purpose instrument.
FT-IR-4200
· Max resolution: 0.5 cm-1
· S/N ratio: 30,000:1
The FT/IR-4200 offers excellent resolution and sensitivity levels to accommodate a variety of complex IR demands. It is suitable for research, development, and quality control applications where high levels of accuracy and precision are required. The FT/IR-4200 can be used for the measurement of both solid and gaseous samples.
|
|
|
|
|
The FT-IR-6000 Series:
High Performance FT-IR with the Highest Signal-to-Noise Ratio Available
|
S/N Ratio 50,000: 1 with 0.07 cm-1 resolution |
|
Gold Optical Surfaces for enhanced FT-Raman Measurements |
|
IR Imaging, Step Scan and Full Vacuum Options Available |
The new JASCO FT/IR-6100, FT/IR-6200, and FT/IR-6300 offer the absolute highest level of performance in the industry with the highest signal-to-noise specifications. Designed for a wide range of critical research and development applications, each model is capable of measuring from the Near IR (15000 cm-1) to the Far IR
(50 cm-1).
The FT/IR-6300 is equipped with gold optical surfaces for more efficient FT-Raman analysis and rapid scan capability as standard. Step scan, high resolution, and full vacuum options are available for all models.
FT/IR-6100
· Max resolution: 0.5 cm-1
· S/N ratio: 42,000:1
The FT/IR-6100 provides a high level of functionality and high accuracy measurement capability at a reasonable price.
FT-IR-6200
· Max resolution: 0. 25 cm-1
· S/N ratio: 45,000:1
The FT/IR-6200, with a higher level of resolution offers an excellent choice for gas analysis and other critical applications such as measurement of impurities in semiconductor processing.
FT-IR-6300
· Max resolution: 0.07 cm-1
· S/N ratio: 50,000:1
The FT/IR-6300 features the absolute highest resolution, and signal-to-noise ratio in the industry. The gold coated optical surfaces provides higher throughput in the Near-IR region and enables expansion to FT-Raman measurement. The FT/IR-6300 includes the Rapid Scan (20 Hz) feature as standard for tracking high speed chemical reactions and other processes.
|
|
|
|
|
Performance and Flexibility Options...
Design the Perfect System for Your Application and Expand as Required
Wave Number Extension
The working range of any JASCO FT-IR can be extended to cover Near to Far-IR applications by switching various optical components, i.e., light source, beam splitters, and detector.
Rapid Scan
The Rapid Scan function is optional for the FT/IR-4100, FT/IR-4200, FT/IR-6100, and FT/IR-6200 and provided as a standard feature of the FT/IR-6300. The Rapid Scan system enables the instrument to perform up to 20 scans per second for the FT/IR-6100/6200/6300 and 10 scans per second for the FT/IR-4100/4200 providing real-time analysis of reaction kinetics.
Step Scan (FT-IR-6000 Series only)
Step Scan FT-IR spectroscopy offers the capability to obtain rapid time-resolved infrared measurements. This technique covers the entire mid-IR region allowing simultaneous measurement at all frequencies while maintaining the high throughput and multiplex advantages of FT-IR. The time-resolved Step Scan FT-IR technique involves displacing the moveable mirror of the interferometer in a step-wise manner. Using the Step Scan technique it is possible to monitor the progress of very fast and reproducible events.
Microscope/IR Imaging
JASCO offers two infrared microscope models which can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument. When used with the FT/IR-6000 the IMV-4000 multi-channel infrared microscope offers advanced capability for applications such as time-resolved imaging.
IQ Accessory Recognition
IQ Accessory Recognition automatically recognizes the sampling accessory when inserted into the instrument sample compartment, using the previously declared instrument parameters for spectral data acquisition. The IQ System can be programmed for any commercially available sampling accessory.
|
|
 |
|
FT-IR Portable Series VIR-9000
VIR-9400/9500/9600 Series
The VIR-9000 series is a compact, lightweight, flexible FT-IR system. The collimated entrance and exit ports make it an ideal instrument for a wide range of applications. The standard instrument includes a hermetically sealed interferometer, DLATGS detector, high intensity source, KRS-5 windows and automatic alignment. Options can be added for increased sensitivity, optional spectral ranges including NIR, and battery operation.
VIR-9400
· Economical, general-purpose instrument
· Max resolution 4 cm-1
· S/N ratio: 10,000:1 (DLATGS, 1 minute, 4 cm-1 resolution)
VIR-9500
· Maximum resolution for both solids and gases
· Spectral range: 7,000 to 400 cm-1
· Max resolution 0.5 cm-1
· S/N ratio: 10,000:1 (DLATGS, 1 minute, 4 cm-1 resolution)
VIR-9600
· NIR configuration including CaF2 beamsplitter, halogen source
· Spectral range: 15,000 to 2,200 cm-1
· Max resolution 0.5 cm-1
Dedicated accessory configurations include gas cells, microscopes, fiber optics, and open path analyzers. The MPS sample compartment allows connection to commercially available FT-IR accessories. The system is designed for high performance in the laboratory and in the field.
The VIR-9000 series incorporates the highly acclaimed, cross-platform software suite, Spectra Manager™. Spectra Manager incorporates instrument control, data processing and a high-speed interface to a laptop or desktop computer. Optional programs are available for quantitative analysis, multivariate analysis and film thickness analysis.
Dedicated Accessories and Multi-purpose Configurations
The dedicated VIR accessories allow quick interfacing between multiple FT-IR techniques including the Smart-Tech accessory developed specifically for forensic drug investigations. Choose from the accessories below or use the MPS to interface with any commercial FT-IR accessory.
|
Fiber-optic measurement system
|
|
Fiber-optic accessories allow on-line monitoring of reaction vessels or product manufacturing systems. Using NIR wavelengths, remote sampling is possible using fiber-optic lengths from 1 to 50 meters. Fiber-optic accessories enable the non-destructive analysis of components in industrial products such as foods, pharmaceuticals, and chemical mixtures without sample preparation. A variety of fiber-optic accessory configurations include ATR, transmission, diffuse reflection or specular reflection probes.
|
|
Gas measurement system
|
|
The short optical path of the VIR series greatly reduces the interference of water vapor and carbon dioxide. This allows trace analysis of impurities in high-purity gases such as those used for semiconductor manufacturing.
|
|
Powder measurement system
|
|
The patented Smart-Tech™ diffuse reflectance accessory ensures easy analysis of solids and powders without dilution in KBr. Unskilled operators can get excellent results with little or no sample preparation.
|
|
Multi-purpose sample chamber
|
|
The MPS-9100 multi-purpose sample chamber allows easy interfacing to standard FT-IR accessories including transmission cells, ATR, DRIFTS, specular and grazing angle reflectance accessories. The MPS offers the user the added benefits of JASCO’s IQ accessory recognition and Quick-Start™ functions that are already incorporated in other JASCO FT-IR instruments.
|
|
|
 |
|
Sample compartment type microscope for FT/IR-4000/6000 Series
The Irtron micro can be easily set into the sample compartment within seconds.
No optical alignment is required before measurements.
Read more...
|
|
 |
|
 |
|
|
