System Description
A broad range of applications including the collection of transmittance/re?ectance spectra of a sample,
measurement of the band gap and ?lm thickness of semiconductors, evaluation of the optical characteristics
of functional crystals and the color analysis of microscopic samples can be easily implemented using the
MSV-5000 series.
The MSV-5000 series includes 3 different microscope systems:
MSV-5100 Spectrophotometer
The MSV-5100 is a dedicated UV-Vis microscope with a wavelength range of (200-900 nm).
MSV-5200 Spectrophotometer
The MSV-5200 includes a Peltier-cooled PbS detector and has a wavelength range of (200-2700 nm).
MSV-5300 Spectrophotometer
The MSV-5300 incorporates an InGaAs detector to obtain optimized NIR measurements and has a wavelength range of (200-1700 nm).
The wide-band cassegrain objectives provide continuous transmittance/reflectance measurements for the entire spectral range desired, without the use of expensive, coated refractive objectives. An optional automated XYZ stage also offers mapping/imaging capability for larger samples.
A PC-controlled objective carousel can be used to select any of the available 10X, 16X or 32X objectives in combination with the standard optical zoom feature to provide enhanced video imaging of the sample utilizing a high-resolution CMOS camera. Options include binocular viewing, polarized observation and selected refractive objective lenses.
All models incorporate a user-selectable slitwidth for variable spectral resolution as well as selectable circular apertures and an adjustable rectangular aperture for sample area discrimination.
System Features
Wide spectral measurement range
The microscope system utilizes wide-band cassegrain
objectives to provide transmittance/reflectance measurements
continuously from 200 to 2700 nm (MSV-5200).
Polarization measurement
An automated Glan-Taylor polarizer system (standard)
provides polarization measurements in combination with the
optional automated polarization analyzer.
Auto XYZ stage
The optional automated stage enhances the operation
performance of the system especially for mapping and
multi-point measurements.
JASCO Spectra Manager™ II
Spectra Manager™ II software, a cross-platform control
and analysis package for all JASCO spectroscopic
instruments, offers quick and easy data acquisition and
analysis.
