The JASCO FT/IR-4000 and FT/IR-6000 Series redefine the application of this powerful, easy-to-use technique. Each compact model offers reliable operation with the highest signal-to-noise ratio in the industry. Featuring a highly stable interferometer and AccuTrac™ DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.
Our FT-IR Series comes standard with the highest industry level integrated search software solution, KnowItAll® searchable database.
Corner cube mirrors
Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times.
Excellent S/N ratio
Featuring a highly stable interferometer and DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.
Highly sensitive detector
A highly sensitive and stable DLATGS detector is standard for all instrument models. The DLATGS detector element is temperature-controlled using the Peltier effect.
The working range can be extended to cover visible to Far-IR applications by switching various optical components.
A specially designed vibration-proof mounting of the optical bench completely eliminates interference from external vibrations.
For laboratories compliant with GxP regulations, an instrument validation routine is provided as standard to verify instrument performance compliant with ASTM, EP, and JP procedures.
All models include a fully purgeable optical system as standard.
JASCO offers several different infrared microscope models which can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument.
Other System Attributes
• Compact size
• Easy to use
• Maintenance free optics
• High Performance
The Start Button on the instrument allows immediate start of measurements with a single push of the button.
The IQ Start function automatically performs a sequence of procedures pre-registered by the Quick start measurement program, after pushing the Start Button.
IQ Accessory Recognition
Automatic recognition of the sampling accessory inserted into the sample compartment.
The Rapid Scan function is optional for the FT/IR-4100, FT/IR-4200, FT/IR-6100, and FT/IR-6200 and provided as a standard feature for the FT/IR-6300.
The Step Scan function is optional for the FT/IR-6000 Series. Using the Step Scan technique it is possible to monitor the progress of very fast and reproducible events.
Spectral Search Program
Sadtler search software package, “KnowItAll™ Informatics System, JASCO Edition” with a library of 10,000 spectra is standard. Step scan
The FT/IR-6000 Series can be upgraded to a full vacuum system.