With over fifty years of experience in infrared spectroscopy, JASCO offers a series of advanced FT-IR instruments and sampling accessories. JASCO provides the most complete selection of FT-IR capability from education and routine analysis to high performance research systems including optimized dedicated systems for advanced technology applications such as measuring film thickness and CVD in-situ monitoring for semiconductor research.
The JASCO FT/IR-4000 and FT/IR-6000 Series redefine the application of this powerful, easy-to-use technique. Each compact model offers reliable operation with the highest signal-to-noise ratio in the industry. All instruments feature a highly stable, corner-cube interferometer and AccuTrac™ DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.
Our FT-IR Series includes the powerful and intuitive integrated search software solution, the KnowItAll® database Search software package from Sadtler .
Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times.
Featuring a highly stable interferometer and DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.
A highly sensitive and stable DLATGS detector is standard for all instrument models. The DLATGS detector element is temperature-controlled using the Peltier effect.
The working range can be extended to cover visible to Far-IR applications by switching various optical components.
A specially designed vibration-proof mounting of the optical bench completely eliminates interference from external vibrations.
For laboratories compliant with GxP regulations, an instrument validation routine is provided as standard to verify instrument performance compliant with ASTM, EP, and JP procedures.
All models include a fully sealed and dessicated interferometer chamber. In addition, an integrated purge for the optical system is included as standard.
JASCO offers several different infrared microscope models which can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument.
The Start Button on the instrument allows immediate start of sample measurements with a single push of the button.
A sequence of operations, including data processing, can be defined in the instrument control software, the operational sequence initiated by a simple press of the Start button. No fumbling for the mouse or multiple clicks to obtain a final FT-IR spectrum!
Automatic recognition of the sampling accessory inserted into the sample compartment.
The Rapid Scan function is optional for the FT/IR-4600, FT/IR-4700, FT/IR-6600, and FT/IR-6700 and provided as a standard feature for the FT/IR-6800.
The Step Scan function is optional for the FT/IR-6000 Series. Using the Step Scan technique it is possible to monitor the progress of very fast and reproducible events.
The Sadtler search software package, “KnowItAll™ Informatics System, JASCO Edition” with a library of 10,000 chemical and polymer spectra is standard.
The FT/IR-6000 Series can be upgraded to a full vacuum system.
Click one of the FTIR Spectroscopy applications below:
The FT/IR-4000 and 6000 Series FTIR Spectrometers can be used for any routine analysis to research applications,...
The NEW FT/IR-4000 and 6000 Series FT-IR Spectrometers provide capabilities and routine analysis to research...