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FT-IR Spectrometers

With over fifty years of experience in infrared spectroscopy, JASCO offers a series of advanced FT-IR instruments and sampling accessories. JASCO provides the most complete selection of FT-IR capability from education and routine analysis to high performance research systems including optimized dedicated systems for advanced technology applications such as measuring film thickness and CVD in-situ monitoring for semiconductor research.

FT-IR Spectrometers

System Description

The JASCO FT/IR-4000 and FT/IR-6000 Series redefine the application of this powerful, easy-to-use technique. Each compact model offers reliable operation with the highest signal-to-noise ratio in the industry. All instruments feature a highly stable, corner-cube interferometer and AccuTrac™ DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.

Our FT-IR Series includes the powerful and intuitive integrated search software solution, the  KnowItAll® database Search software package from Sadtler .

System Features

Corner cube mirrors

Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times.

Corner cube mirrors

Excellent S/N ratio

Featuring a highly stable interferometer and DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.

Highly sensitive detector

A highly sensitive and stable DLATGS detector is standard for all instrument models. The DLATGS detector element is temperature-controlled using the Peltier effect.

Wavenumber extension

The working range can be extended to cover visible to Far-IR applications by switching various optical components.

Vibration-free scanning

A specially designed vibration-proof mounting of the optical bench completely eliminates interference from external vibrations.

GxP support

For laboratories compliant with GxP regulations, an instrument validation routine is provided as standard to verify instrument performance compliant with ASTM, EP, and JP procedures.

Purgeable optics

All models include a fully sealed and dessicated interferometer chamber. In addition, an integrated purge for the optical system is included as standard.

Microscope/IR Imaging

JASCO offers several different infrared microscope models which can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument.

Other System Attributes

  • Compact size
  • Easy to use
  • Maintenance free optics
  • High Performance
  • Flexibility
  • Expandability

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Application Notes Library

Application Notes Library

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Training for FT-IR Sample Analysis

Training for UV-VIS-NIR

October 24-25, 2016

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