The MSV-5000 is a UV-Visible or UV-Visible/NIR microscope that uses a high resolution double-beam scanning spectrophotometer for precise and accurate measurement in the wavelength region 200-2700 nm.
A broad range of applications including the collection of transmittance/reflectance spectra of a sample, measurement of the band gap and film thickness of semiconductors, evaluation of the optical characteristics of functional crystals and the color analysis of microscopic samples can be easily implemented using the MSV-5000 series.
The MSV-5000 series includes 3 different configurations for UV-Visible/NIR microscopy:
A PC-controlled objective carousel can be used to select any of the available 10X, 16X or 32X cassegrain objectives in combination with a standard optical zoom feature to provide enhanced video imaging of the sample using a high-resolution CMOS camera. Options include binocular viewing, polarized observation and refractive objective lenses.
|Light Source (Option)|
|Wavelength Range||200 - 900 nm||200 - 2700 nm||200 - 1600 nm|
|Wavelength Accuracy||± 0.3 nm (656.1 nm)||
± 1.5 nm (1312.2 nm)
|Spectral Bandwidth||1, 2, 5, 10, L2, L5, L10 nm||1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)
4, 8, 20, 40, L8, L20, L40 nm (NIR)
|1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)
2, 4, 10, 20, L4, L10, L20 nm (NIR)
|Sample Observation (Option)|
(Automated condenser mirror compensation function)
10, 20, 30, 50, 100, 200 µmf (×16 objective)
5, 10, 15, 25, 50, 100 µmf (×32 objective)
16, 32, 48, 80, 160, 320 µmf (×10 objective)
|Sample Stage (Option)|
measurement start/stop, auto focus, automatic condenser mirror compensation, optical zoom,
automated sample illumination, sample compartment illumination ON/OFF, ATOS illumination ON/OFF
|Program (Option) *3|